Vehicle Components Defect Detection via Machine Vision

Authors

  • Armen S. Petrosyan Institute for Informatics and Automation Problems of NAS RA

DOI:

https://doi.org/10.51408/1963-0067

Keywords:

Particle/Contour Analysis, Edge Detection, Digital Image Processing, Machine Vision

Abstract

The task of quality control and automatic defect detection on production lines is one of the most important tasks of machine vision and digital image processing (DIP). This article provides one example of solving such a problem using various DIP algorithms.

References

National Instruments LabVIEW Development System, www.ni.com.

A. K. Jain, Fundamentals of Digital Image Processing, Prentice-Hall Inc, Englewood Cliffs, 1989.

National Instruments Corporation, “NI Vision Concepts Manual”, 2000-2009.

E. R. Davies, Computer and Machine Vision: Theory, Algorithms, Practicalities, 4th Edition, ELSEVIER, 2012.

A. Petrosyan, “Infrared image processing for solar cell defect detection”, Proceedings of International Conference Computer Science and Information Technologies, pp. 300—304, 2017.

M. K. Bhuyan, Computer Vision and Image Processing, Fundamentals and Applications, CRC Press , Published October 27, 2019.

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Published

2021-12-10

How to Cite

Petrosyan, A. S. . (2021). Vehicle Components Defect Detection via Machine Vision. Mathematical Problems of Computer Science, 54, 131–137. https://doi.org/10.51408/1963-0067

Issue

Vol. 54 (2020): Mathematical Problems of Computer Science

Section

Articles

License

Creative Commons License

This work is licensed under a Creative Commons Attribution-NonCommercial 4.0 International License.