ABGARYAN, G. A. . A Built-in Self-Test System for External DRAM. Mathematical Problems of Computer Science, [S. l.], v. 54, p. 80–87, 2020. DOI: 10.51408/1963-0061. Disponível em: https://mpcs.sci.am/index.php/mpcs/article/view/468. Acesso em: 11 may. 2021.